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Title: A New Wrinkle in Thin Film Science
Url: https://www.nsf.gov/news/news_summ.jsp?cntn_id=109673&org=NSF
Creator: Banegas, Diane E.
Publisher: National Science Foundation (U.S.)
Description: This National Science Foundation news release presents a newly introduced technique, involving simple materials and instruments, for studying the mechanical properties of nanometer films. The release explains how these measurements are made and why they are important.
LC Classification: Science -- Physics -- Atomic physics. Constitution and properties of matter -- Properties of matter and antimatter (General) -- Condensed matter physics
Science -- Physics -- Atomic physics. Constitution and properties of matter -- Solids. Solid state physics -- Thin films -- Special thin film substances and types, A-Z
Technology -- Electrical engineering. Electronics. Nuclear engineering -- Electrical engineering. Electronics. Nuclear engineering -- Electronics -- Apparatus and materials -- Other, A-Z -- Thin film devices
Technology -- Technology (General) -- Nanotechnology
GEM Subject: Science -- Engineering
Science -- Physics
Key Concept: Physics -- Matter
Manufacturing -- Nanofabrication
Date Issued: 2007-08-03
Resource Type: Reference Material
Instructional Material
Format: Image -- JPEG
Document -- HTML
Audience: Educator
Learner
Education Level: Higher Education
Higher Education -- Undergraduate (Lower Division)
Higher Education -- Undergraduate (Upper Division)
Higher Education -- Technical Education (Upper Division)
Higher Education -- Technical Education (Lower Division)
Vocational/Professional Development Education
Language: English
Access Rights: Free access
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Source: comPADRE
Full Record Views: 10
Resource URL Clicks: 12
Cumulative Rating: NOT YET RATED
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